SMART Samsung HD103UJ - Fehler oder nicht?

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Hi,

ich habe eine Samsung HD103UJ seit April letzten Jahres. Seit einiger Zeit meldet das System beim Start "SMART event logged".
Ein gründlicher Testlauf mit ESTool sagt jedoch, dass die Platte völlig ok ist. smartctl unter Linux und der SMART selftest sagen jedoch, dass Fehler auftreten, aber kein SMART-Fehler vorliegt (siehe unten).

Ein chkdsk /F /R unter Windows zeigt mir einige kaputte Sektoren in der Zusammenfassung an, aber sagt, dass das Dateisystem ok ist. Das alleine würde mir keine Sorgen machen, aber in Verbindung mit dem SMART selftest ist das schon komisch.

Wie ist eure Meinung? Reicht das für nen RMA?

Gruß,
gone

smartctl 5.39 2009-12-09 r2995 [i486-slackware-linux-gnu] (local build)
Copyright (C) 2002-9 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F1 DT series
Device Model:     SAMSUNG HD103UJ
Firmware Version: 1AA01113
User Capacity:    1,000,203,804,160 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3b
Local Time is:    Fri Feb  5 21:50:06 2010 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 114)	The previous self-test completed having
					the read element of the test failed.
Total time to complete Offline 
data collection: 		 (11425) seconds.
Offline data collection
capabilities: 			 (0x7b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 191) minutes.
Conveyance self-test routine
recommended polling time: 	 (  20) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   098   051    Pre-fail  Always       -       31
  3 Spin_Up_Time            0x0007   076   076   011    Pre-fail  Always       -       8170
  4 Start_Stop_Count        0x0032   099   099   000    Old_age   Always       -       663
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   253   253   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       10102
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       1478
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       656
 13 Read_Soft_Error_Rate    0x000e   100   098   000    Old_age   Always       -       31
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       14
184 End-to-End_Error        0x0033   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       259
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   080   057   000    Old_age   Always       -       20 (Lifetime Min/Max 17/20)
194 Temperature_Celsius     0x0022   079   056   000    Old_age   Always       -       21 (Lifetime Min/Max 17/21)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       282041
196 Reallocated_Event_Count 0x0032   099   099   000    Old_age   Always       -       25
197 Current_Pending_Sector  0x0012   100   099   000    Old_age   Always       -       1
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       1
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       5
200 Multi_Zone_Error_Rate   0x000a   099   099   000    Old_age   Always       -       11
201 Soft_Read_Error_Rate    0x000a   253   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed: read failure       20%      1471         543910264
# 2  Short offline       Completed: read failure       20%      1471         543910264
# 3  Short offline       Completed: read failure       20%      1470         543910264
# 4  Short offline       Completed without error       00%      1439         -
# 5  Extended offline    Completed: read failure       90%      1425         543906203
# 6  Short offline       Completed: read failure       20%      1422         543910264

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.