N
nismo2000
Guest
Hallo Forum,
soeben hat mein FreeBSD 11.1 Server mit einem ZFS Pool (RaidZ1, 3x4TB WD RED) beim scrubbing sich verschluckt.
Das Sorgenkind ist /dev/ada3
smartctl -a /dev/ada3 sagt:
Soll ich die Platte (bald) tauschen?
soeben hat mein FreeBSD 11.1 Server mit einem ZFS Pool (RaidZ1, 3x4TB WD RED) beim scrubbing sich verschluckt.
Das Sorgenkind ist /dev/ada3
Code:
root@server:/home/nismo # zpool status
pool: storage
state: ONLINE
scan: scrub in progress since Sat Oct 28 16:15:18 2017
41,4G scanned out of 4,48T at 187M/s, 6h55m to go
384K repaired, 0,90% done
config:
NAME STATE READ WRITE CKSUM
storage ONLINE 0 0 0
raidz1-0 ONLINE 0 0 0
ada1 ONLINE 0 0 0
ada2 ONLINE 0 0 0
ada3 ONLINE 0 0 0 (repairing)
errors: No known data errors
smartctl -a /dev/ada3 sagt:
Code:
root@server:/home/nismo # smartctl -a /dev/ada3
smartctl 6.5 2016-05-07 r4318 [FreeBSD 11.1-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD40EFRX-68WT0N0
Serial Number: WD-WCC4E4DACYPR
LU WWN Device Id: 5 0014ee 2b7227afa
Firmware Version: 82.00A82
User Capacity: 4.000.787.030.016 bytes [4,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sat Oct 28 16:19:25 2017 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (54480) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 545) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x703d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 77
3 Spin_Up_Time 0x0027 175 175 021 Pre-fail Always - 8208
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 8
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 080 080 000 Old_age Always - 14625
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 6
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 1
193 Load_Cycle_Count 0x0032 187 187 000 Old_age Always - 39195
194 Temperature_Celsius 0x0022 124 121 000 Old_age Always - 28
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 5
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5 occurred at disk power-on lifetime: 14625 hours (609 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 c0 9f 00 40 Error: UNC at LBA = 0x00009fc0 = 40896
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 50 9f 00 40 08 6d+19:07:00.037 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:56.731 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:53.288 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:50.036 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:46.757 READ DMA
Error 4 occurred at disk power-on lifetime: 14625 hours (609 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 c0 9f 00 40 Error: UNC at LBA = 0x00009fc0 = 40896
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 50 9f 00 40 08 6d+19:06:56.731 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:53.288 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:50.036 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:46.757 READ DMA
Error 3 occurred at disk power-on lifetime: 14625 hours (609 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 c0 9f 00 40 Error: UNC at LBA = 0x00009fc0 = 40896
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 50 9f 00 40 08 6d+19:06:53.288 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:50.036 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:46.757 READ DMA
Error 2 occurred at disk power-on lifetime: 14625 hours (609 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 c0 9f 00 40 Error: UNC at LBA = 0x00009fc0 = 40896
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 50 9f 00 40 08 6d+19:06:50.036 READ DMA
c8 00 00 50 9f 00 40 08 6d+19:06:46.757 READ DMA
Error 1 occurred at disk power-on lifetime: 14625 hours (609 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 c0 9f 00 40 Error: UNC at LBA = 0x00009fc0 = 40896
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 00 50 9f 00 40 08 6d+19:06:46.757 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Soll ich die Platte (bald) tauschen?