root@omv:~# smartctl -a /dev/sdd
smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-4-amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red
Device Model: WDC WD60EFRX-68MYMN1
Serial Number: WD-WX11D351HLCD
LU WWN Device Id: 5 0014ee 2617ee19e
Firmware Version: 82.00A82
User Capacity: 6.001.175.126.016 bytes [6,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 9
ATA Standard is: Not recognized. Minor revision code: 0x001f
Local Time is: Sun Aug 16 10:10:08 2015 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3344) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 100 253 021 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 45
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 5
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 2
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 43
194 Temperature_Celsius 0x0022 124 115 000 Old_age Always - 28
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 15 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 15 occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 09:41:57.773 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 09:41:57.773 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 09:41:57.773 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 09:41:57.772 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 09:41:57.771 SMART WRITE LOG
Error 14 occurred at disk power-on lifetime: 17 hours (0 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 09:41:57.773 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 09:41:57.773 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 09:41:57.772 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 09:41:57.771 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 09:41:57.770 SMART WRITE LOG
Error 13 occurred at disk power-on lifetime: 3 hours (0 days + 3 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 03:07:29.566 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 03:07:29.565 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 03:07:29.565 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 03:07:29.565 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 03:07:29.564 SMART WRITE LOG
Error 12 occurred at disk power-on lifetime: 3 hours (0 days + 3 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 03:07:29.565 SMART READ LOG
b0 d5 01 e1 4f c2 00 08 03:07:29.565 SMART READ LOG
b0 d6 01 e0 4f c2 00 08 03:07:29.565 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 03:07:29.564 SMART WRITE LOG
b0 d6 01 e0 4f c2 00 08 03:07:29.563 SMART WRITE LOG
Error 11 occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 0b 00 00 00 00 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 e1 4f c2 00 08 02:49:08.854 SMART READ LOG
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Interrupted (host reset) 90% 32 -
# 2 Extended offline Aborted by host 90% 7 -
# 3 Short offline Interrupted (host reset) 10% 3 -
# 4 Short offline Aborted by host 10% 3 -
# 5 Short offline Aborted by host 10% 3 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Die habe ich angestoßen. Normalerweise läuft das NAS 24/7 und alle 19 Stunden sollte SMART einen ausführlichen Selbsttest machen.
